Electron microscopes

Electron microscopy uses an electron beam to create an image of a sample. Because of this an electron microscope has a much greater resolving power than a light microscope and is capable of much highermagnifications (up to 2 million times). There are two types of electron microscopes - transmission electron microscopes (TEM) and scanning electron microscopes (SEM).

JEOL JEM2100

JEOL JEM2100

For high resolution analytical (cryo-) TEM and tomography, the JEOL JEM2100 is available. It can produce extremely high magnification images (up to 800,000x) with high resolution (up to 0.1 nm). JEOL JEM2100 has an acceleration voltage up to 200 kV and a 16 megapixel digital camera. The machine accommodates measurements under cryogenic temperatures, using the available cryo-holder and sample preparation equipment for imaging thin biological and other aqueous samples.



Specifications

  • High resolution 200 kV transmission electron microscope
  • GATAN US4000 digital camera (4K x 4K images)
  • Compustage for accurate and automated tilting
  • High-tilt specimen holder (tilting from -70° to 70°) for tomography
  • Software for automated recording of tilt series
  • JEOL TEMographyTM suite (Recorder, Composer and Visualizer)
  • SerialEM, Chimera, Image J
  • GATAN cryo-holder




JEOL JEM1011

JEOL JEM1011

The JEOL JEM1011 TEM is the more accessible alternative for routine analysis and measurements. It can produce highmagnification images (up to 600,000x) with sub-nanometer resolution (upto 0.4 nm). JEOL JEM1011 has an acceleration voltage up to 100kV. This system is equipped with two digital cameras (1 and 4 megapixel) for capturing images meeting your needs.



Specifications

  • Routine transmission electron microscope (max. 100 kV)
  • SIS Keenview digital camera (1K x 1K images)
  • SIS Veleta digital camera (2K x 2K images)
  • iTEM imaging software for image acquisition and quantification




FEI Magellan 400 FESEM

FEI Magellan 400 FESEM

The Magellan 400 is a fully digital FESEM with Schottkey field emitter source providing subnanometer resolution over the full 1 kV to 30 kV electron energy range. The microscope has two detectors a Everhart-Thornley SE detector for SE detection, and NG in-lens detector (TLD) designed for high-resolution imaging even at low kV’s. The Magellan is equipped with a new generation energy dispersive spectroscopy (EDS) system from Oxford Instruments. Furthermore the Magellan is equipped with a cryostage and cryotransfer system.

Specifications

  • High resolution scanning electron microscope
  • Accelerating Voltage: 50V-30kV
  • Beam current: 0.6 pA to 22 nA
  • Resolution: 0.8nm@15kV, 0.9nm@1kV
  • Leica VCT100 cryotransfer system
  • Leica cryoMED020 cryopreparation unit
  • Oxford Aztec EDX
  • “Under” lens SE and BSE detection