X-ray diffraction is a versatile and non-destructive analysis method for the determination of material properties such as phase composition, structure and texture of powders, solids and liquids. Depending on the composition, X-ray radiation will be diffracted in a specific way in samples due to the regular distribution of atoms in a crystal. The diffraction pattern provides information about among others phase, crystal structure and crystal size
|Goniometer||D8 ADVANCE Theta/Theta|
|Tube||2.2 kW Cu long fine focus|
|Tube Power||40 kV / 40 mA|
|Primary optics||Motorized divergence slits|
|Sample stage||Standard rotation stage with Motorized Air-Scatter Knife|
|Anton Paar TTK600 temperature chamber UMC- stage|
|Capillary stage; standard goniometer head|
|Secondary optics||Soller slits|
- Identification of the crystal (by comparison with data from a database).
- Identification and characterisation of solid crystalline materials (including multi-phase mixtures).
- Determination of purity of crystals.
- Small Angle X-ray Scattering (SAXS): determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes, characteristic distances of partially ordered material.
- Wide Angle X-ray Diffraction (WAXD: the determination of the crystallinity of polymers such as polyesters, polyamides, and in cellulose and starch.
- Wide Angle X-ray Diffraction (WAXD): the determination of the size and phase of metal nanoparticles as well as the support materials in heterogeneous catalysts
- X-Ray Reflectometry (XRR): determination of layer thickness (0.1 nm-1000nm )
- Measuring XRD patterns at different temperatures
- Measuring XRD patterns in transmission mode with capillary sample holder.