X-ray diffraction X-ray reflection

X-ray diffraction is used to determine the identity of crystalline solids (minerals) based on their atomic structure. Diffraction occurs because X-rays have wavelengths in the order of a few angstroms which are about the same as the interatomic distances in crystalline solids.

 

Characteristics:

X’pert Pro diffraction  (Panalytical) system for phase analysis  and thickness measurement of thin layers.

• The X-ray source used is a sealed tube with a copper anode (1.54056 Å). The goniometer is a two-axis system.
• Sample stage can be heated from 5°C to 200°C.
• The set-up can be used to study molecular spacings of a size ranging from ~100 Å to ~1 Å with an accuracy of well below an angstrom.
• ICDD reference database for identifying approx. 300.000 Crystalline Solids